// SPDX-License-Identifier: GPL-2.0 /* * Bad Block Table support for the OneNAND driver * * Copyright(c) 2005 Samsung Electronics * Kyungmin Park <kyungmin.park@samsung.com> * * Derived from nand_bbt.c * * TODO: * Split BBT core and chip specific BBT.
*/
/** * check_short_pattern - [GENERIC] check if a pattern is in the buffer * @buf: the buffer to search * @len: the length of buffer to search * @paglen: the pagelength * @td: search pattern descriptor * * Check for a pattern at the given place. Used to search bad block * tables and good / bad block identifiers. Same as check_pattern, but * no optional empty check and the pattern is expected to start * at offset 0. *
*/ staticint check_short_pattern(uint8_t *buf, int len, int paglen, struct nand_bbt_descr *td)
{ int i;
uint8_t *p = buf;
/* Compare the pattern */ for (i = 0; i < td->len; i++) { if (p[i] != td->pattern[i]) return -1;
} return 0;
}
/** * create_bbt - [GENERIC] Create a bad block table by scanning the device * @mtd: MTD device structure * @buf: temporary buffer * @bd: descriptor for the good/bad block search pattern * @chip: create the table for a specific chip, -1 read all chips. * Applies only if NAND_BBT_PERCHIP option is set * * Create a bad block table by scanning the device * for the given good/bad block identify pattern
*/ staticint create_bbt(struct mtd_info *mtd, uint8_t *buf, struct nand_bbt_descr *bd, int chip)
{ struct onenand_chip *this = mtd->priv; struct bbm_info *bbm = this->bbm; int i, j, numblocks, len, scanlen; int startblock;
loff_t from;
size_t readlen; struct mtd_oob_ops ops = { }; int rgn;
printk(KERN_INFO "Scanning device for bad blocks\n");
len = 2;
/* We need only read few bytes from the OOB area */
scanlen = 0;
readlen = bd->len;
/* chip == -1 case only */ /* Note that numblocks is 2 * (real numblocks) here; * see i += 2 below as it makses shifting and masking less painful
*/
numblocks = this->chipsize >> (bbm->bbt_erase_shift - 1);
startblock = 0;
from = 0;
for (j = 0; j < len; j++) { /* No need to read pages fully,
* just read required OOB bytes */
ret = onenand_bbt_read_oob(mtd,
from + j * this->writesize + bd->offs, &ops);
/* If it is a initial bad block, just ignore it */ if (ret == ONENAND_BBT_READ_FATAL_ERROR) return -EIO;
if (ret || check_short_pattern(&buf[j * scanlen],
scanlen, this->writesize, bd)) {
bbm->bbt[i >> 3] |= 0x03 << (i & 0x6);
printk(KERN_INFO "OneNAND eraseblock %d is an " "initial bad block\n", i >> 1);
mtd->ecc_stats.badblocks++; break;
}
}
i += 2;
if (FLEXONENAND(this)) {
rgn = flexonenand_region(mtd, from);
from += mtd->eraseregions[rgn].erasesize;
} else
from += (1 << bbm->bbt_erase_shift);
}
return 0;
}
/** * onenand_memory_bbt - [GENERIC] create a memory based bad block table * @mtd: MTD device structure * @bd: descriptor for the good/bad block search pattern * * The function creates a memory based bbt by scanning the device * for manufacturer / software marked good / bad blocks
*/ staticinlineint onenand_memory_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd)
{ struct onenand_chip *this = mtd->priv;
return create_bbt(mtd, this->page_buf, bd, -1);
}
/** * onenand_isbad_bbt - [OneNAND Interface] Check if a block is bad * @mtd: MTD device structure * @offs: offset in the device * @allowbbt: allow access to bad block table region
*/ staticint onenand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt)
{ struct onenand_chip *this = mtd->priv; struct bbm_info *bbm = this->bbm; int block;
uint8_t res;
/* Get block number * 2 */
block = (int) (onenand_block(this, offs) << 1);
res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03;
pr_debug("onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n",
(unsignedint) offs, block >> 1, res);
switch ((int) res) { case 0x00: return 0; case 0x01: return 1; case 0x02: return allowbbt ? 0 : 1;
}
return 1;
}
/** * onenand_scan_bbt - [OneNAND Interface] scan, find, read and maybe create bad block table(s) * @mtd: MTD device structure * @bd: descriptor for the good/bad block search pattern * * The function checks, if a bad block table(s) is/are already * available. If not it scans the device for manufacturer * marked good / bad blocks and writes the bad block table(s) to * the selected place. * * The bad block table memory is allocated here. It is freed * by the onenand_release function. *
*/ staticint onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd)
{ struct onenand_chip *this = mtd->priv; struct bbm_info *bbm = this->bbm; int len, ret = 0;
len = this->chipsize >> (this->erase_shift + 2); /* Allocate memory (2bit per block) and clear the memory bad block table */
bbm->bbt = kzalloc(len, GFP_KERNEL); if (!bbm->bbt) return -ENOMEM;
/* Set erase shift */
bbm->bbt_erase_shift = this->erase_shift;
if (!bbm->isbad_bbt)
bbm->isbad_bbt = onenand_isbad_bbt;
/* Scan the device to build a memory based bad block table */ if ((ret = onenand_memory_bbt(mtd, bd))) {
printk(KERN_ERR "onenand_scan_bbt: Can't scan flash and build the RAM-based BBT\n");
kfree(bbm->bbt);
bbm->bbt = NULL;
}
return ret;
}
/* * Define some generic bad / good block scan pattern which are used * while scanning a device for factory marked good / bad blocks.
*/ static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
/** * onenand_default_bbt - [OneNAND Interface] Select a default bad block table for the device * @mtd: MTD device structure * * This function selects the default bad block table * support for the device and calls the onenand_scan_bbt function
*/ int onenand_default_bbt(struct mtd_info *mtd)
{ struct onenand_chip *this = mtd->priv; struct bbm_info *bbm;
this->bbm = kzalloc(sizeof(struct bbm_info), GFP_KERNEL); if (!this->bbm) return -ENOMEM;
bbm = this->bbm;
/* 1KB page has same configuration as 2KB page */ if (!bbm->badblock_pattern)
bbm->badblock_pattern = &largepage_memorybased;
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