// SPDX-License-Identifier: GPL-2.0
/* Copyright(c) 2013 - 2018 Intel Corporation. */
#include "i40e_diag.h"
#include "i40e_prototype.h"
/**
* i40e_diag_reg_pattern_test
* @hw: pointer to the hw struct
* @reg: reg to be tested
* @mask: bits to be touched
**/
static int i40e_diag_reg_pattern_test(struct i40e_hw *hw,
u32 reg, u32 mask)
{
static const u32 patterns[] = {
0 x5A5A5A5A, 0 xA5A5A5A5, 0 x00000000, 0 xFFFFFFFF
};
u32 pat, val, orig_val;
int i;
orig_val = rd32(hw, reg);
for (i = 0 ; i < ARRAY_SIZE(patterns); i++) {
pat = patterns[i];
wr32(hw, reg, (pat & mask));
val = rd32(hw, reg);
if ((val & mask) != (pat & mask)) {
i40e_debug(hw, I40E_DEBUG_DIAG,
"%s: reg pattern test failed - reg 0x%08x pat 0x%08x val 0x%08x\n" ,
__func__, reg, pat, val);
return -EIO;
}
}
wr32(hw, reg, orig_val);
val = rd32(hw, reg);
if (val != orig_val) {
i40e_debug(hw, I40E_DEBUG_DIAG,
"%s: reg restore test failed - reg 0x%08x orig_val 0x%08x val 0x%08x\n" ,
__func__, reg, orig_val, val);
return -EIO;
}
return 0 ;
}
const struct i40e_diag_reg_test_info i40e_reg_list[] = {
/* offset mask elements stride */
{I40E_QTX_CTL(0 ), 0 x0000FFBF, 1 ,
I40E_QTX_CTL(1 ) - I40E_QTX_CTL(0 )},
{I40E_PFINT_ITR0(0 ), 0 x00000FFF, 3 ,
I40E_PFINT_ITR0(1 ) - I40E_PFINT_ITR0(0 )},
{I40E_PFINT_ITRN(0 , 0 ), 0 x00000FFF, 1 ,
I40E_PFINT_ITRN(0 , 1 ) - I40E_PFINT_ITRN(0 , 0 )},
{I40E_PFINT_ITRN(1 , 0 ), 0 x00000FFF, 1 ,
I40E_PFINT_ITRN(1 , 1 ) - I40E_PFINT_ITRN(1 , 0 )},
{I40E_PFINT_ITRN(2 , 0 ), 0 x00000FFF, 1 ,
I40E_PFINT_ITRN(2 , 1 ) - I40E_PFINT_ITRN(2 , 0 )},
{I40E_PFINT_STAT_CTL0, 0 x0000000C, 1 , 0 },
{I40E_PFINT_LNKLST0, 0 x00001FFF, 1 , 0 },
{I40E_PFINT_LNKLSTN(0 ), 0 x000007FF, 1 ,
I40E_PFINT_LNKLSTN(1 ) - I40E_PFINT_LNKLSTN(0 )},
{I40E_QINT_TQCTL(0 ), 0 x000000FF, 1 ,
I40E_QINT_TQCTL(1 ) - I40E_QINT_TQCTL(0 )},
{I40E_QINT_RQCTL(0 ), 0 x000000FF, 1 ,
I40E_QINT_RQCTL(1 ) - I40E_QINT_RQCTL(0 )},
{I40E_PFINT_ICR0_ENA, 0 xF7F20000, 1 , 0 },
{ 0 }
};
/**
* i40e_diag_reg_test
* @hw: pointer to the hw struct
*
* Perform registers diagnostic test
**/
int i40e_diag_reg_test(struct i40e_hw *hw)
{
int ret_code = 0 ;
u32 reg, mask;
u32 elements;
u32 i, j;
for (i = 0 ; i40e_reg_list[i].offset != 0 &&
!ret_code; i++) {
elements = i40e_reg_list[i].elements;
/* set actual reg range for dynamically allocated resources */
if (i40e_reg_list[i].offset == I40E_QTX_CTL(0 ) &&
hw->func_caps.num_tx_qp != 0 )
elements = hw->func_caps.num_tx_qp;
if ((i40e_reg_list[i].offset == I40E_PFINT_ITRN(0 , 0 ) ||
i40e_reg_list[i].offset == I40E_PFINT_ITRN(1 , 0 ) ||
i40e_reg_list[i].offset == I40E_PFINT_ITRN(2 , 0 ) ||
i40e_reg_list[i].offset == I40E_QINT_TQCTL(0 ) ||
i40e_reg_list[i].offset == I40E_QINT_RQCTL(0 )) &&
hw->func_caps.num_msix_vectors != 0 )
elements = hw->func_caps.num_msix_vectors - 1 ;
/* test register access */
mask = i40e_reg_list[i].mask;
for (j = 0 ; j < elements && !ret_code; j++) {
reg = i40e_reg_list[i].offset +
(j * i40e_reg_list[i].stride);
ret_code = i40e_diag_reg_pattern_test(hw, reg, mask);
}
}
return ret_code;
}
/**
* i40e_diag_eeprom_test
* @hw: pointer to the hw struct
*
* Perform EEPROM diagnostic test
**/
int i40e_diag_eeprom_test(struct i40e_hw *hw)
{
int ret_code;
u16 reg_val;
/* read NVM control word and if NVM valid, validate EEPROM checksum*/
ret_code = i40e_read_nvm_word(hw, I40E_SR_NVM_CONTROL_WORD, ®_val);
if (!ret_code &&
((reg_val & I40E_SR_CONTROL_WORD_1_MASK) ==
BIT(I40E_SR_CONTROL_WORD_1_SHIFT)))
return i40e_validate_nvm_checksum(hw, NULL);
else
return -EIO;
}
Messung V0.5 in Prozent C=94 H=93 G=93
¤ Dauer der Verarbeitung: 0.13 Sekunden
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